SINGAPORE, Singapore

Michael Taylor

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Mobility Gmbh. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Taylor. Retrieved from https://idiyas.com/inventor/michael-taylor-h5bzuquj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Michael Taylor: Innovator in Technical Component Analysis

Introduction: Michael Taylor is a distinguished inventor based in Singapore, known for his innovative contributions to the field of technical component analysis. With a focus on reliability and safety, his work has significant implications for various industries.

Latest Patents: Michael holds a patent for a "Method for analyzing conditions of technical components." This method provides a systematic approach to analyze the conditions of technical components by assessing rarity and abnormalities. The process involves describing conditions in a behavioral input space defined by state variables, analyzing conditions of individual components, and comparing them with other components to detect abnormalities.

Career Highlights: Michael Taylor is currently employed at Siemens Mobility GmbH, where he applies his expertise in technical analysis. His work contributes to the development of safer and more reliable systems in the mobility sector.

Collaborations: Michael collaborates with talented professionals such as Udhayaraj Sivalingam and Helge Aufderheide, enhancing the innovative capabilities of his team.

Conclusion: Michael Taylor's contributions to the analysis of technical components exemplify the importance of innovation in ensuring system reliability and safety. His work continues to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…