Company Filing History:
Years Active: 2024
Title: Michael Shentcis: Innovator in Optical Metrology
Introduction
Michael Shentcis is a notable inventor based in Milpitas, California. He has made significant contributions to the field of optical metrology, particularly through his innovative patent that utilizes short-wave infrared wavelengths. His work is instrumental in advancing measurement technologies.
Latest Patents
Michael Shentcis holds a patent for an optical metrology tool that includes various features designed to enhance measurement accuracy. The patent, titled "Optical Metrology Utilizing Short-Wave Infrared Wavelengths," describes a system that incorporates illumination sources generating light in both the short-wave infrared (SWIR) spectral range and outside of it. The tool is equipped with illumination optics to direct this light onto a sample, along with two imaging channels. The first imaging channel uses a detector to capture images based on wavelengths in the SWIR range, while the second channel captures images outside this range. A controller processes these images to generate precise optical metrology measurements.
Career Highlights
Michael Shentcis is currently employed at Kla Corporation, where he continues to develop innovative solutions in optical measurement technologies. His expertise and dedication to his field have positioned him as a valuable asset to his company and the industry at large.
Collaborations
Throughout his career, Michael has collaborated with talented individuals such as Amnon Manassen and Isaac Salib. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Michael Shentcis is a prominent figure in the realm of optical metrology, with a focus on utilizing short-wave infrared wavelengths to enhance measurement techniques. His contributions through patents and collaborations reflect his commitment to advancing technology in this field.