Angleton, TX, United States of America

Michael Rutkowske

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Dow Global Technolgoies LLC. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Rutkowske. Retrieved from https://idiyas.com/inventor/michael-rutkowske

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Michael Rutkowske: Innovator in Sealant Technology

Introduction

Michael Rutkowske is a notable inventor based in Angleton, Texas. He has made significant contributions to the field of sealant technology, showcasing his expertise through his innovative patent.

Latest Patents

Rutkowske holds a patent for a sealant composition and the method of producing it. This invention includes a unique formulation that comprises 70 to 99.5 percent by weight of an ethylene/α-olefin interpolymer composition. The composition is designed to enhance the performance and application of sealants in various industries.

Career Highlights

Michael Rutkowske is currently employed at Dow Global Technologies LLC, where he continues to develop and refine innovative materials. His work focuses on creating advanced sealant solutions that meet the evolving needs of the market.

Collaborations

Rutkowske collaborates with talented professionals such as Mehmet Demirors and Rongjuan Cong. Together, they contribute to the advancement of sealant technologies and materials science.

Conclusion

Michael Rutkowske's contributions to sealant technology exemplify his innovative spirit and dedication to improving material applications. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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