Company Filing History:
Years Active: 2021
Title: Michael Rozler: Innovator in Semiconductor Radiation Detection
Introduction
Michael Rozler is a notable inventor based in Victoria, Canada. He has made significant contributions to the field of semiconductor radiation detection. His innovative work focuses on enhancing the calibration methods for radiation detectors, which are crucial in various scientific and industrial applications.
Latest Patents
Michael Rozler holds a patent for "Methods of calibrating semiconductor radiation detectors using K-edge filters." This patent describes a method where a set of N standard bin count distributions is generated by irradiating a test radiation detector system with an X-ray beam attenuated by different K-edge filters. The calibration process involves adjusting the energy bins of the target radiation detector system to match measured bin count distributions with corresponding standard distributions. This method not only improves calibration accuracy but also allows for the measurement and calibration of energy resolution in radiation detectors.
Career Highlights
Michael Rozler is associated with Redlen Technologies, Inc., where he applies his expertise in semiconductor technology. His work at Redlen Technologies has positioned him as a key player in advancing radiation detection technologies. His innovative approaches have contributed to the company's reputation for excellence in the field.
Collaborations
Michael has collaborated with talented individuals such as Elmaddin Guliyev and Georgios Prekas. These collaborations have fostered a productive environment for innovation and development in semiconductor technologies.
Conclusion
Michael Rozler's contributions to semiconductor radiation detection through his patented methods demonstrate his commitment to innovation in this critical field. His work continues to influence advancements in radiation detection technologies.