Toronto, Canada

Michael Pacheco

This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Pacheco. Retrieved from https://idiyas.com/inventor/michael-pacheco-hgftezcm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Michael Pacheco and Software Vulnerability Detection

Introduction

Michael Pacheco is an inventor based in Toronto, Canada. His patent work addresses the challenge of identifying software vulnerability fixes in code repositories. He is associated with Huawei Technologies Co., Ltd.

Latest Patents

Pacheco is credited with 1 patent: “Systems and Methods for Detection of Software Vulnerability Fix.” The invention describes a system that analyzes code changes in a repository commit. It preprocesses the commit into file-level token sequences, uses a transformer model to create vector representations of the changes, and combines those representations into a commit-level vector. A classifier then predicts whether the commit fixes a vulnerability, and the system produces a report identifying the commit and its predicted vulnerability-fix score.

Career Highlights

Pacheco’s documented patent contribution focuses on applying machine-learning techniques to software security. By evaluating code changes at both file and commit levels, the described system aims to help identify and report commits that may address software vulnerabilities.

Collaborations

Pacheco is associated with Huawei Technologies Co., Ltd. His listed coworkers include Jiayuan Zhou and Xin Xia.

Conclusion

Michael Pacheco’s patent highlights an approach to software security that combines transformer-based code representations with classification to detect potential vulnerability fixes in repository commits.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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