Sparta, NJ, United States of America

Michael P May

This inventor holds 1 USPTO granted patent. Top assignee: Alliedsignal Inc.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael P May. Retrieved from https://idiyas.com/inventor/michael-p-may-qvi022nj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Michael P May: Innovator in Polyamide Manufacturing

Introduction

Michael P May is a notable inventor based in Sparta, NJ (US). He has made significant contributions to the field of materials science, particularly in the development of articles of manufacture that exhibit high resistance to chemicals, solvents, and heat.

Latest Patents

One of his key patents is focused on articles of manufacture comprising extruded polyamide-low density. This invention involves a blend of a polyamide, such as polycaprolactam, a functionalized polyethylene like low-density polyethylene, and an unfunctionalized low-density polyethylene. The resulting blend has a melt viscosity suitable for extrusion into various forms, including convoluted tubing, nonconvoluted tubing, sheets, and films.

Career Highlights

Michael P May is associated with AlliedSignal Inc., where he has been instrumental in advancing innovative manufacturing processes. His work has contributed to the development of materials that are not only durable but also versatile in application.

Collaborations

Some of his coworkers include Murali K Akkapeddi and Sengshiu J Chung, who have collaborated with him on various projects within the company.

Conclusion

Michael P May's contributions to the field of materials science through his innovative patents and collaborations highlight his role as a significant inventor in the industry. His work continues to influence the development of advanced manufacturing techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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