Michael P Clinton

Title: Michael P. Clinton: Memory-Technology Inventor

Introduction

Michael P. Clinton is an inventor associated with Essex Junction, Vermont, and International Business Machines Corporation (IBM). His work includes inventions related to memory-device testing and high-speed DRAM architecture. He is credited with 4 patents.

Latest Patents

Among Clinton’s latest patents is “Apparatus and Method for Performing a Defect Leakage Screen Test for Memory Devices,” which concerns testing memory devices for defects.

Another is “Narrow Data Width DRAM with Low Latency Page-Hit Operations.” The invention describes a high-speed RAM device organized into independently addressable logical banks, each with a memory-array segment and a page register. It further divides each bank into two segments, including a smaller, faster random-access memory (FRAM) segment that stores initial data in a stream. A high-speed page register connects this segment directly to a multiplexer and demultiplexer linked to the device’s I/O ports, bypassing the internal bus protocol. This arrangement can reduce latency for initial page-hit data transfers while avoiding the cost of implementing the entire memory device with high-speed FRAM.

Career Highlights

Clinton’s listed patent work reflects a focus on memory systems, including DRAM performance and memory-device defect screening. His association with IBM places this work within the company’s broader technology and research environment.

Collaborations

Clinton’s listed coworkers include Mark William Kellogg and Wilbur David Pricer. The available information identifies them as coworkers but does not specify their roles in particular patents.

Conclusion

Michael P. Clinton’s patent portfolio highlights contributions to memory-device testing and DRAM design, with an emphasis on improving performance while managing implementation costs.