Wayland, MA, United States of America

Michael Ouradnik

USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Michael Ouradnik: Innovator in Spectral Data Analysis

Introduction

Michael Ouradnik is a notable inventor based in Wayland, MA (US). He has made significant contributions to the field of spectral data analysis, particularly in identifying artifacts that can affect the accuracy of spectral data obtained from tissue samples. His innovative approach has the potential to enhance diagnostic processes in medical applications.

Latest Patents

Michael Ouradnik holds a patent for a "Method and apparatus for identifying spectral artifacts." This invention provides an apparatus and methods for determining whether spectral data obtained from a region of a tissue sample are affected by artifacts. Artifacts can include lighting issues such as glare and shadow, as well as obstruction artifacts like blood or other obstructions. The invention also offers methods for obtaining redundant spectral data, which is crucial when some data sets are affected by artifacts while others remain unaffected. This redundant data can be instrumental in accurately diagnosing conditions related to tissue samples.

Career Highlights

Michael Ouradnik is associated with Medispectra, Incorporated, where he applies his expertise in spectral data analysis. His work focuses on improving the reliability of spectral data in medical diagnostics, which can lead to better patient outcomes. His innovative methods are paving the way for advancements in the field.

Collaborations

Michael has collaborated with notable colleagues, including Kevin Schomacker and Thomas M Meese. These partnerships have contributed to the development and refinement of his patented technologies.

Conclusion

Michael Ouradnik's contributions to the field of spectral data analysis exemplify the impact of innovation in medical diagnostics. His work not only addresses critical challenges in identifying artifacts but also enhances the reliability of diagnostic processes.

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