Location History:
- Phoenix, AZ (US) (2009)
- Pasadena, CA (US) (2011)
Company Filing History:
Years Active: 2009-2011
Title: Michael Mello: Innovator in Optical Interferometry
Introduction
Michael Mello is a distinguished inventor based in Pasadena, California. He has made significant contributions to the field of optical interferometry, focusing on surface characterization techniques. With a total of 2 patents, Mello's work has advanced the understanding and measurement of surface properties.
Latest Patents
Mello's latest patents include innovative methods for surface characterization. The first patent, titled "Surface characterization based on optical phase shifting interferometry," describes an apparatus, techniques, and systems for implementing an optical interferometer. This invention measures surfaces by mapping instantaneous curvature or in-plane and out-of-plane displacement field gradients. It achieves this by obtaining and processing four optical interferograms from a common optical reflected beam, which are relatively separated in phase by π/2.
The second patent, "Surface characterization based on lateral shearing of diffracted wave fronts to measure in-plane and out-of-plane displacement gradient fields," outlines apparatus and techniques for using optical shearing interferometry. This method allows for full field mapping of in-plane and out-of-plane displacement field gradients of a sample surface.
Career Highlights
Michael Mello is affiliated with the California Institute of Technology, where he continues to push the boundaries of optical measurement technologies. His work has garnered attention for its practical applications in various scientific and engineering fields.
Collaborations
Mello collaborates with Ares J Rosakis, a fellow researcher at the California Institute of Technology. Their partnership has led to advancements in the understanding of optical measurement techniques.
Conclusion
Michael Mello's contributions to optical interferometry have established him as a key figure in the field. His innovative patents and collaborations continue to influence surface characterization methodologies.