The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Oct. 02, 2006
Applicants:
Michael Mello, Phoenix, AZ (US);
Ares J. Rosakis, Altadena, CA (US);
Inventors:
Michael Mello, Phoenix, AZ (US);
Ares J. Rosakis, Altadena, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus and techniques for using an optical shearing interferometry to obtain full field mapping of in-plane and out-of-plane displacement field gradients of a sample surface of a sample.
Quick Actions:
Mello, Michael. (2009). Surface characterization based on lateral shearing of diffracted wave fronts to measure in-plane and out-of-plane displacement gradient fields (U.S. Patent No. 7538891). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7538891
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile