San Jose, CA, United States of America

Michael MacDonald

This inventor holds 2 USPTO granted patents. Top assignee: Molecular Devices Corporation. Active years: 2023-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael MacDonald. Retrieved from https://idiyas.com/inventor/michael-macdonald-jw041723

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Michael MacDonald: Innovator in Image Classification Technology

Introduction

Michael MacDonald is a prominent inventor based in San Jose, CA (US). He has made significant contributions to the field of image classification, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of Michael's latest patents focuses on systems and methods for image classification. This patent describes a method for inspecting features of an image using an image inspection controller that includes a processor communicatively coupled to a memory. The method involves receiving an input image at the processor, performing either a semantic segmentation process or an object classification process to generate an output image, and prompting a user to select between approving the displayed output image or performing additional processes on it.

Career Highlights

Michael MacDonald is currently employed at Molecular Devices Corporation, where he continues to develop cutting-edge technologies in image processing. His work has been instrumental in advancing the capabilities of image inspection systems.

Collaborations

Michael has collaborated with notable coworkers, including Yousef Al-Kofahi and Mohammed Yousefhussien, contributing to a dynamic and innovative work environment.

Conclusion

Michael MacDonald is a key figure in the realm of image classification technology, with a focus on enhancing image inspection methods. His contributions are paving the way for advancements in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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