San Francisco, CA, United States of America

Michael M Aust

This inventor holds 2 USPTO granted patents. Top assignees: The Ais Group, Inc., Other. Active years: 2007-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael M Aust. Retrieved from https://idiyas.com/inventor/michael-m-aust

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2007-2010

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2 patents (USPTO):Explore Patents

Title: Michael M Aust: Innovator in Load Cell Technology

Introduction

Michael M Aust is a notable inventor based in San Francisco, CA. He has made significant contributions to the field of load cell technology, holding a total of 2 patents. His innovative approaches have enhanced the accuracy and reliability of load measurement systems.

Latest Patents

Michael M Aust's latest patents focus on systems for compensating for creep and hysteresis in load cells. One of his patents describes a method of compensating for hysteresis in a load cell by pre-calibrating the load cell through measuring deflection under progressively increasing and decreasing loads. This involves determining two sets of coefficients that correlate the deflection of the load cell to the measured load. The method allows for accurate load cell deflection determination by selecting the appropriate coefficients based on the load's progression.

Career Highlights

Throughout his career, Michael has worked with various companies, including The Ais Group, Inc. His experience in the industry has allowed him to develop and refine his innovative techniques in load cell technology.

Collaborations

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Conclusion

Michael M Aust's contributions to load cell technology through his patents demonstrate his commitment to innovation and precision in measurement systems. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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