Munich, Germany

Michael Knop

This inventor holds 1 USPTO granted patent. Top assignee: Frankl & Kirchner Gmbh & Co Kg. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Knop. Retrieved from https://idiyas.com/inventor/michael-knop-j7secnmy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Michael Knop: Innovator in Industrial Sewing Machine Technology

Introduction

Michael Knop is a notable inventor based in Munich, Germany. He has made significant contributions to the field of industrial sewing machines, showcasing his innovative spirit through his patented technology.

Latest Patents

Michael holds a patent for control equipment designed for industrial sewing machines. This invention allows for the activation and deactivation of various functions and connection states through switchgears such as switches, probes, and sensors. The control equipment is engineered to generate consistent output signals despite varying input voltages, enhancing the reliability and efficiency of industrial sewing operations.

Career Highlights

Michael is currently employed at Frankl & Kirchner GmbH & Co. K.G., where he applies his expertise in developing advanced sewing machine technologies. His work has been instrumental in improving the functionality and performance of industrial sewing equipment.

Collaborations

Michael collaborates with talented colleagues, including Thomas Schmidt and Wolfgang Sinn, who contribute to the innovative environment at Frankl & Kirchner GmbH & Co. K.G.

Conclusion

Michael Knop's contributions to industrial sewing machine technology exemplify his dedication to innovation and excellence in engineering. His patented control equipment represents a significant advancement in the industry, reflecting his commitment to enhancing manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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