Burke, VA, United States of America

Michael K Yetzbacher

USPTO Granted Patents = 7 

Average Co-Inventor Count = 3.3

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2015-2025

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7 patents (USPTO):Explore Patents

Title: Michael K Yetzbacher: Innovator in Nanometrology and Imaging Technologies

Introduction

Michael K Yetzbacher is a notable inventor based in Burke, Virginia, with a significant contribution to the fields of nanometrology and imaging technologies. He holds a total of six patents, showcasing his innovative approach to solving complex technical challenges. His work primarily focuses on enhancing measurement accuracy and improving imaging systems.

Latest Patents

Among his latest patents is a method of calibrating a nanometrology instrument. This method involves using a calibration reference that includes a substrate and multiple bi-layer stacks. Each bi-layer stack consists of several bi-layer steps, with at least one step incorporating two materials, including an etch stop layer and a bulk layer. The calibration reference step profile is measured using a topography metrology instrument, which is then calibrated based on these measurements.

Another significant patent is for a multiple band short wave infrared mosaic array filter. This invention features a camera system that includes a mosaic optical color filter array composed of repeating unit cells. These cells are designed to ensure spectral consistency and spatial uniformity, minimizing inter-band correlation between neighboring bands. The system is further enhanced by a short-wave infrared detector that is optically coupled to the filter array.

Career Highlights

Michael K Yetzbacher works for the United States as represented by the Secretary of the Navy. His role involves applying his expertise in developing advanced technologies that support national defense and security. His innovative contributions have been instrumental in enhancing the capabilities of various measurement and imaging systems.

Collaborations

Michael has collaborated with notable colleagues, including Andrew J Boudreau and Marc Christophersen. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Michael K Yetzbacher's work exemplifies the spirit of innovation in the fields of nanometrology and imaging technologies. His patents reflect a commitment to advancing measurement techniques and imaging systems, contributing to significant advancements in these areas.

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