This inventor holds 1 USPTO granted patent. Top assignee: Eastman-Kodak Company. Active years: 1978.
Company Filing History:
Years Active: 1978
Title: Michael K Milley: Innovator in Length Measurement Technology
Introduction
Michael K Milley is a notable inventor based in Rochester, NY (US). He has made significant contributions to the field of measurement technology, particularly with his innovative patent that addresses the challenges of measuring the length of continuously advancing articles.
Latest Patents
Milley's most recent patent is titled "Length measurement apparatus for continuously advancing articles." This invention provides an apparatus designed to measure the length of a series of continuously advancing and non-transparent articles. Each article possesses an actual length L that is distributed around a predetermined or nominal length L.sub.o. The apparatus comprises two radiation/sensor pairs that are spaced apart by the nominal length L.sub.o. Positioned along an axis parallel to the direction of article advancement, one radiation/sensor pair serves as a trigger to indicate when either the leading or trailing edge of the advancing article reaches a predetermined position. At this moment, the signal from the remaining radiation/sensor pair is memorized or recorded. This memorized voltage indicates the position of the leading or trailing edge of the advancing article, thus providing a measure of the article's actual length. The disclosed apparatus also includes a circuit to compensate for the effects of temperature variations and component drift.
Career Highlights
Michael K Milley is associated with the Eastman Kodak Company, where he has applied his expertise in measurement technology. His work has contributed to advancements in the field, showcasing his commitment to innovation and precision.
Collaborations
Milley has collaborated with Gary W Ahlquist, further enhancing the development of measurement technologies within their organization.
Conclusion
Michael K Milley stands out as an inventor whose work in length measurement technology has made a significant impact. His innovative patent reflects his dedication to improving measurement accuracy in continuously advancing articles.