Munich, Germany

Michael Just

This inventor holds 1 USPTO granted patent. Top assignee: Lre Technology Partner Gmbh. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Just. Retrieved from https://idiyas.com/inventor/michael-just-ulsmybff

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Michael Just - Innovator in Measuring Technology

Introduction

Michael Just is a notable inventor based in München, Germany. He has made significant contributions to the field of measuring technology, particularly through his innovative patent. His work focuses on creating systems that enhance the accuracy and efficiency of measurements in various applications.

Latest Patents

Michael Just holds a patent for a "Measuring device with a measuring module and a clock." This measuring system integrates a clock with multiple measuring modules, each equipped with a data processing unit, data input unit, and an indicator unit. The design allows for the non-galvanic coupling of selected measuring modules with the clock, facilitating data transmission. Each module can be connected to the clock to perform specific measuring functions based on time data. The system is versatile, capable of measuring various parameters related to the human body or the environment.

Career Highlights

Michael Just is associated with Lre Technology Partner GmbH, where he continues to develop and refine his innovative measuring technologies. His work has positioned him as a key player in the industry, contributing to advancements in measurement systems.

Collaborations

Some of his notable coworkers include Udo Bartsch and Klaus Deuter, who collaborate with him on various projects within the company.

Conclusion

Michael Just's contributions to measuring technology exemplify innovation and practicality. His patent reflects a commitment to enhancing measurement systems, making a significant impact in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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