Santa Rosa, CA, United States of America

Michael Joseph Seibel


Average Co-Inventor Count = 2.4

ph-index = 1


Company Filing History:


Years Active: 2015-2025

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3 patents (USPTO):Explore Patents

Title: Michael Joseph Seibel: Innovator in Reflectometer Technology

Introduction

Michael Joseph Seibel is a prominent inventor based in Santa Rosa, CA (US). He has made significant contributions to the field of reflectometer technology, holding a total of 3 patents. His work focuses on enhancing the performance and efficiency of signal processing systems.

Latest Patents

One of Seibel's latest patents is for a dual directional asymmetric coupler with a shared through-line. This innovative reflectometer design includes two directional couplers configured in parallel, which are positioned across from each other on opposite sides of a shared section of a signal line. One coupler couples a portion of the signal power from a first signal flowing from one end of the shared through-line to the other end. The second coupler does the same for a second signal flowing in the opposite direction. This configuration results in reduced size and signal loss compared to traditional serial coupler setups. When integrated into vector network analyzer (VNA) systems, it leads to higher output power and improved dynamic range.

Career Highlights

Michael Seibel is currently employed at National Instruments Corporation, where he continues to develop cutting-edge technologies in the field of signal processing. His expertise and innovative approach have positioned him as a key player in the industry.

Collaborations

Seibel has collaborated with talented individuals such as Marcus Kieling daSilva and Justin R Magers. These partnerships have contributed to the advancement of his projects and the successful implementation of his inventions.

Conclusion

Michael Joseph Seibel is a notable inventor whose work in reflectometer technology has made a significant impact on the field. His innovative designs and collaborations continue to push the boundaries of signal processing systems.

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