The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jul. 13, 2021
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

Justin Regis Magers, Santa Rosa, CA (US);

Michael Joseph Seibel, Santa Rosa, CA (US);

Marcus Kieling daSilva, Leander, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/06 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 27/06 (2013.01); G01R 27/28 (2013.01);
Abstract

A reflectometer may include two directional couplers in a parallel configuration, sharing the same section of a signal line or through-line. For example, two directional couplers may be disposed across from each other on opposite sides of the shared through-line. One of the directional couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other directional coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss with respect to reflectometers having a serial configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.


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