St. Petersburg, FL, United States of America

Michael John Flanagan

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael John Flanagan. Retrieved from https://idiyas.com/inventor/michael-john-flanagan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Michael John Flanagan: Inventor of a Spectral Signal Detection System.

Introduction

Michael John Flanagan is an inventor associated with St. Petersburg, Florida, and Honeywell International Inc. His patent work includes a system designed to improve the detection of chemical vapor clouds in spectral data.

Latest Patents

Flanagan is credited with 1 patent: “Spectral Signal Detection System.” The invention continuously estimates and removes background signals from a sequence of spectra. It can use estimated background spectra from multiple fields of view, whether or not those fields have backgrounds similar to the target field. By removing spectral characteristics unrelated to the target cloud, the system aims to increase the probability of detecting the chemical vapor.

Career Highlights

Flanagan’s listed patent reflects work on spectral analysis and chemical detection. The system addresses the challenge of identifying a target signal within a panoramic field divided into many fields of view, where background conditions may vary.

Collaborations

Flanagan’s listed coworkers include Saad J. Bedros and Mirela Onorica Popa. His patent is associated with Honeywell International Inc.

Conclusion

Michael John Flanagan’s patent describes a method for improving chemical vapor detection by estimating and removing background spectra across multiple fields of view.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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