Location History:
- Tinley Park, IL (US) (2017)
- Orland Park, IL (US) (2023)
Company Filing History:
Years Active: 2017-2023
Title: Innovations of Michael J Wojcik in X-ray Imaging Technology
Introduction
Michael J Wojcik is a notable inventor based in Tinley Park, IL (US). He has made significant contributions to the field of X-ray imaging technology, holding a total of 2 patents. His work focuses on advanced imaging techniques that enhance the capabilities of traditional X-ray systems.
Latest Patents
Wojcik's latest patents include a method for coded-mask-based X-ray phase-contrast and dark-field imaging. This innovative approach enables imaging of objects that absorb or reflect very little X-ray light. The method involves providing radiation to a coded mask with a known phase and absorption profile according to a predetermined pattern. The radiation is then directed at a sample, and the detected radiation is used for phase reconstruction and image processing. This method allows for the application of maximum-likelihood and machine learning techniques to reconstruct images from the detected radiation.
Another significant patent is the mechanical design of a multiple zone plates precision alignment apparatus for hard X-ray focusing at a twenty-nanometer scale. This enhanced design includes a zone plate alignment base frame, multiple zone plates, and zone plate holders for precise mounting and alignment. Each positioning stage drives and positions the respective zone plate holder, ensuring thermal expansion stability and positioning accuracy for the apparatus.
Career Highlights
Michael J Wojcik is currently employed at UChicago Argonne, LLC, where he continues to innovate in the field of X-ray imaging. His work has been instrumental in advancing the technology used in various scientific and medical applications.
Collaborations
Wojcik has collaborated with notable colleagues such as Deming Shu and Jie Liu, contributing to the development of cutting-edge imaging technologies.
Conclusion
Michael J Wojcik's contributions to X-ray imaging technology through his innovative patents demonstrate his expertise and commitment to advancing the field. His work continues to impact various applications, enhancing the capabilities of imaging systems.