Company Filing History:
Years Active: 1999-2002
Title: Michael J Sharpes: Innovator in Integrated Circuit Testing
Introduction
Michael J Sharpes is a notable inventor based in Boise, ID (US). He has made significant contributions to the field of semiconductor device testing, holding a total of 3 patents. His work focuses on creating efficient and compact testing apparatuses that enhance the performance and reliability of integrated circuits.
Latest Patents
One of his latest patents is a modular design for an integrated circuit testing apparatus. This innovative apparatus is compact and modularly designed for testing and burning-in semiconductor devices. It comprises first and second power supplies, utilizing direct current (DC) to DC converters. The first power supply provides a high voltage low amperage power source to drive the devices under test (DUTs). The second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage are supplied to slot boards, while the DC to DC converters alter the voltage and current to digital levels. This design allows for much smaller connectors and a modularly designed burn-in oven, significantly improving the testing process.
Career Highlights
Michael J Sharpes is currently employed at Micron Technology Incorporated, where he continues to innovate in the field of semiconductor testing. His expertise and dedication to improving testing methodologies have made him a valuable asset to the company.
Collaborations
He collaborates with Robert L Totorica, working together to advance the technology and efficiency of integrated circuit testing.
Conclusion
Michael J Sharpes is a prominent inventor whose work in integrated circuit testing has led to significant advancements in the field. His innovative designs and collaborative efforts continue to shape the future of semiconductor technology.