Wellington, New Zealand

Michael J Lynch

This inventor holds 1 USPTO granted patent. Top assignee: Interlock Industries, Inc.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael J Lynch. Retrieved from https://idiyas.com/inventor/michael-j-lynch-pjcrc6pq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Michael J. Lynch

Introduction

Michael J. Lynch is a notable inventor based in Wellington, New Zealand. He has made significant contributions to the field of window operation technology. His innovative spirit is exemplified through his patent, which showcases his expertise and creativity.

Latest Patents

Michael holds a patent for a "Coupling Eye for a Window Operator." This invention is designed to enhance the functionality and efficiency of window operators, demonstrating his commitment to improving everyday technologies. He has 1 patent to his name, reflecting his focused approach to innovation.

Career Highlights

Michael is currently employed at Interlock Industries, Inc., where he continues to develop and refine his inventions. His work at this company allows him to collaborate with other talented professionals in the field.

Collaborations

One of his notable coworkers is Rana James Waitai. Together, they contribute to the innovative projects at Interlock Industries, Inc., fostering a collaborative environment that encourages creativity and advancement.

Conclusion

Michael J. Lynch is a dedicated inventor whose work in window operation technology has made a lasting impact. His patent and contributions to Interlock Industries, Inc. highlight his innovative capabilities and commitment to enhancing everyday products.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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