Company Filing History:
Years Active: 2006
Title: Michael Iaquinta: Innovator in Material Detection Technology
Introduction
Michael Iaquinta is a notable inventor based in Westerville, OH (US). He has made significant contributions to the field of material detection technology. His innovative approach has led to the development of a unique method for detecting and measuring secondary materials deposited on moving substrates.
Latest Patents
Michael Iaquinta holds a patent for a method titled "Method for detecting and measuring a secondary material intermittently deposited to a moving substrate." This invention employs an x-ray source to direct an x-ray beam at a moving substrate. An x-ray detector is utilized to measure the amount of x-ray energy transmitted through the substrate. The method effectively identifies areas of bare substrate versus those containing secondary materials, allowing for precise detection and measurement.
Career Highlights
Michael Iaquinta is associated with Automation and Control Technology, Inc., where he applies his expertise in material detection. His work has been instrumental in advancing technologies that enhance the efficiency and accuracy of material analysis.
Collaborations
Michael collaborates with talented individuals such as David Pond and John W. Pettit. Their combined efforts contribute to the innovative projects at Automation and Control Technology, Inc.
Conclusion
Michael Iaquinta's contributions to material detection technology exemplify the impact of innovation in industrial applications. His patented method showcases the potential for advancements in the analysis of secondary materials, paving the way for future developments in the field.