The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Dec. 02, 2004
Michael Iaquinta, Westerville, OH (US);
David Pond, Dublin, OH (US);
John W. Pettit, Derwood, MD (US);
Michael Iaquinta, Westerville, OH (US);
David Pond, Dublin, OH (US);
John W. Pettit, Derwood, MD (US);
Automation and Control Technology, Inc., Columbus, OH (US);
Abstract
A method for detecting and measuring regions of a secondary material deposited onto a moving substrate. The method employs an x-ray source for directing an x-ray beam at the moving substrate, and an x-ray detector to detect an amount of x-ray energy transmitted by the moving sheet of material. Areas of bare substrate will allow for different amounts of x-ray transmission than areas of the substrate containing the secondary material. These differences in transmission and/or absorption can be used to detect the location of a region of secondary material and to determine if it falls within an acceptable range. According to one particular embodiment of the present invention, the method can be used to analyze burn characteristic modifying bands of a secondary material intermittently and repeatedly deposited to a moving web of smoking article paper.