Company Filing History:
Years Active: 2008
Title: Michael Gostein: Innovator in Thermal Response Measurement
Introduction
Michael Gostein is an accomplished inventor based in Quincy, MA (US). He has made significant contributions to the field of metrology, particularly in the measurement of properties of patterned thin film metal structures. His innovative approach has led to the development of a unique method that enhances the understanding of material properties through thermal response.
Latest Patents
Michael Gostein holds a patent for a method of determining properties of patterned thin film metal structures using transient thermal response. This invention involves measuring a structure that includes multiple narrow metallic regions, each situated between neighboring regions made of a second, non-metallic material. The method includes exciting the structure by irradiating it with a spatially periodic excitation field composed of excitation stripes to generate a thermal grating. Subsequent steps involve diffracting a probe laser beam off the thermal grating to form a signal beam, detecting the signal beam as a function of time to generate a signal waveform, and determining at least one property of the structure based on a thermal component of the signal waveform. Michael holds 1 patent.
Career Highlights
Michael is currently associated with Advanced Metrology Systems LLC, where he applies his expertise in metrology and thermal response measurement. His work has been instrumental in advancing the understanding of material properties, which is crucial for various applications in technology and engineering.
Collaborations
Michael collaborates with Alexei Maznev, contributing to innovative projects that push the boundaries of metrology and material science.
Conclusion
Michael Gostein's contributions to the field of metrology through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the understanding of material properties, showcasing the importance of innovation in scientific research.