Michael Gonia

Title: Michael Gonia: Innovator in Testing Technology

Introduction

Michael Gonia is a notable inventor based in San Jose, CA. He has made significant contributions to the field of testing technology, particularly with his innovative designs that enhance the efficiency of testing processes.

Latest Patents

Gonia holds a patent for a "Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sites." This invention involves a probe card designed for testing dies of a substrate during a wafer sort process. The probe card includes a printed circuit board (PCB) and a test site that connects to one of the dies during a test cycle. The test site features a first pin connecting band and a first pin set, allowing for a specific configuration to perform a first type of test on a die. Notably, the number of pins in the first pin set is less than those used for a second type of test, which operates at a slower processing speed.

Career Highlights

Michael Gonia is currently employed at Marvell Asia Pte., Ltd., where he continues to develop and refine testing technologies. His work has been instrumental in advancing the capabilities of testing systems in the semiconductor industry.

Collaborations

Gonia collaborates with talented professionals such as David L Ganapol and Scott Wu, contributing to a dynamic team focused on innovation and excellence in technology.

Conclusion

Michael Gonia's contributions to testing technology exemplify the spirit of innovation in the semiconductor industry. His patent and ongoing work at Marvell Asia Pte., Ltd. highlight his commitment to improving testing processes and efficiency.