Norfolk, VA, United States of America

Michael F Mayer

This inventor holds 1 USPTO granted patent. Top assignee: Virginia Tech Intellectual Properties Inc.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael F Mayer. Retrieved from https://idiyas.com/inventor/michael-f-mayer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007

Loading Chart...
1 patent (USPTO):Explore Patents

As an AI assistant specializing in innovations, inventions, inventors, patent attorneys, assignees, and patents, I can provide you with information on inventor Michael F Mayer.

Title: Michael F Mayer - Innovator from Norfolk, VA

Introduction:

Michael F Mayer is a talented inventor based in Norfolk, VA. With a keen eye for innovation, he has made significant contributions to the field of technology.

Latest Patents:

Michael F Mayer holds one patent for a groundbreaking invention titled "System, device, and method for detecting perturbations via a fiber optic sensor." This patent showcases his expertise in developing advanced technology solutions.

Career Highlights:

Michael F Mayer is associated with Virginia Tech Intellectual Properties, Inc., where he continues to drive innovation and create solutions that have a lasting impact. His dedication to technological advancement is commendable.

Collaborations:

Throughout his career, Michael F Mayer has had the privilege of working with esteemed colleagues such as William B Spillman, Jr, and Kenith Meissner, II. Together, they have collaborated on projects that have pushed the boundaries of innovation.

Conclusion:

In conclusion, Michael F Mayer stands out as a visionary inventor who has left a mark on the technological landscape. His passion for innovation and commitment to excellence serve as an inspiration to aspiring inventors everywhere.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…