This inventor holds 1 USPTO granted patent. Top assignee: Yeda Research and Development Co. Ltd. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Michael Elbaum and Structural Data Extraction from Scanning Microscopy
Introduction
Michael Elbaum is an inventor associated with Tel Aviv, Israel, and Yeda Research and Development Co. Ltd. His patent work concerns extracting structural information from scanning microscope data.
Latest Patents
Elbaum is named on one patent: System and Method for Extraction of Structural Data of a Sample from Scan Data. The invention describes a computer system that processes measurements from a scanning microscope to produce a structural image of a sample. Its data analyzer compensates for image shifts caused by off-axis detection channels, helping separate phase and depth information and extract a depth-contrast image from a single scan dataset.
Career Highlights
Elbaum’s patent reflects work at the intersection of microscopy, image processing, and structural analysis. The disclosed method uses data from multiple detection channels to correct parallax effects and derive depth-related information.
Collaborations
The patent information identifies Shahar Seifer and Lothar Houben as Elbaum’s coworkers. The work is associated with Yeda Research and Development Co. Ltd.
Conclusion
Michael Elbaum’s recorded invention focuses on improving the extraction of structural and depth information from scanning microscope data, with 1 patent listed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile