Odenthal, Germany

Michael Drubel

This inventor holds 1 USPTO granted patent. Top assignee: Smartrac Technology Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Drubel. Retrieved from https://idiyas.com/inventor/michael-drubel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Michael Drubel and His Tire RFID Antenna Innovation.

Introduction

Michael Drubel is an inventor associated with Odenthal, Germany, and Smartrac Technology GmbH. His patent work includes an antenna design intended to improve the tuning of transponders used in tire RFID applications.

Latest Patents

Drubel is associated with 1 patent, titled “Tire RFID Tag with Segmented Dipole Antenna.” The patent describes tuneable linear-antenna transponders and methods for making and using them. Its design uses two conductive radiators that may be identical or different, with each radiator divided into multiple segments. These segments can take the form of linear sections, helical spring sections, or cylindrical sections. Consecutive segments may differ in shape or in the winding width of a helical spring. By providing distinct transmission-line segments, the design offers additional ways to tune antenna resonance.

Career Highlights

Drubel’s listed patent work focuses on RFID antenna technology for tire applications. The segmented radiator approach is designed to provide finer control over antenna resonance.

Collaborations

The supplied information identifies Frederic Meyer and Christoph Ohm as Drubel’s coworkers. It also associates him with Smartrac Technology GmbH.

Conclusion

Michael Drubel’s patent contribution centers on a segmented dipole antenna design that expands the tuning options for tire RFID transponders.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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