Emmendingen, Germany

Michael Dold

This inventor holds 1 USPTO granted patent. Top assignee: Sick Ag. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Dold. Retrieved from https://idiyas.com/inventor/michael-dold-qncyrp17

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 13.0

ph-index = 1

Forward Citations = 73(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovations of Michael Dold

Introduction

Michael Dold is a notable inventor based in Emmendingen, Germany. He has made significant contributions to the field of optoelectronics, particularly with his innovative sensor technology. His work has garnered attention for its potential applications in various industries.

Latest Patents

Michael Dold holds a patent for an optoelectronic sensor. This invention showcases his expertise and commitment to advancing technology in this specialized area. The patent reflects his ability to create solutions that address modern challenges.

Career Highlights

Dold is currently employed at Sick AG, a company known for its advancements in sensor technology and automation solutions. His role at Sick AG allows him to further develop his ideas and contribute to the company's innovative projects. His work has positioned him as a valuable asset in the field of optoelectronics.

Collaborations

Throughout his career, Michael Dold has collaborated with talented individuals such as Stefan Mack and Ralph Rapp. These partnerships have enabled him to enhance his inventions and share knowledge within the industry.

Conclusion

Michael Dold's contributions to optoelectronics, particularly through his patented sensor technology, highlight his innovative spirit and dedication to advancing the field. His work at Sick AG and collaborations with other professionals further emphasize his impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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