This inventor holds 2 USPTO granted patents and 4 published patent applications. Top assignee: Ketek Gmbh Halbleiter-Und Reinraumtechnik. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Michael Darius Fraczek: Innovator in X-ray Detection Technology
Introduction
Michael Darius Fraczek is a notable inventor based in Pliening, Germany. He has made significant contributions to the field of X-ray detection technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and safety of X-ray detection devices.
Latest Patents
Fraczek's latest patents include an innovative X-ray detection device. This device features a housing that contains an X-ray detector, which is designed to detect X-rays within a specific energy detection range. The device also incorporates a collimator that is opaque in part of the energy detection range, partially covering the X-ray detector. Additionally, it includes a first shielding element that provides protection against stray X-rays, ensuring the integrity of both the detector and the housing.
Another significant patent is for a radiation window, encapsulation, and method for producing an encapsulation. This invention includes a window element and a first protection film that enhances the robustness of the window element. The design allows the window element to withstand a pressure difference of at least 1 atm, with specific material properties that optimize its performance.
Career Highlights
Michael Darius Fraczek is currently employed at Ketek GmbH Halbleiter-Und Reinraumtechnik, where he continues to develop cutting-edge technologies in the field of radiation detection. His expertise and innovative approach have positioned him as a key figure in his industry.
Collaborations
Fraczek collaborates with talented professionals such as Andreas Pahlke and Simon Edler, contributing to a dynamic work environment that fosters innovation and creativity.
Conclusion
Michael Darius Fraczek's contributions to X-ray detection technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the technical challenges in the field, and his work continues to influence advancements in radiation detection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile