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For the Inventor, By the Inventor

Smyrna, GA, United States of America

Michael D Dunn

This inventor holds 4 USPTO granted patents. Top assignee: Depuy Orthopaedics, Inc.. Active years: 1998-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael D Dunn. Retrieved from https://idiyas.com/inventor/michael-d-dunn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 4

Forward Citations = 435(Granted Patents)


Location History:

  • Winona Lake, IN (US) (1998 - 1999)
  • Smyrna, GA (US) (2001 - 2004)

Company Filing History:

goldMedal4 out of 153 
 
Depuy Orthopaedics, Inc.
 patents

Years Active: 1998-2004

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4 patents (USPTO):Explore Patents
1. 6793676 - Method of reconstructing a joint (2004-09-21),
2. 6176880 - Tissue graft construct for replacement of cartilaginous structures (2001-01-23),
3. 5922028 - Multi-layered SIS tissue graft construct for replacement of (1999-07-13),
4. 5788625 - Method of making reconstructive SIS structure for cartilaginous elements (1998-08-04),

Title: Top Inventor in Smyrna, Georgia

Introduction: Jonathan Blake Brannon is a prominent inventor based in Smyrna, Georgia. He has made significant contributions to various fields through his innovative ideas and patents.

Latest Patents: Jonathan has recently been awarded several patents that showcase his creativity and technical expertise.

Career Highlights: Throughout his career, he has achieved numerous milestones that highlight his dedication to innovation and problem-solving.

Collaborations: Jonathan has worked with various organizations and individuals, fostering partnerships that enhance his inventive pursuits.

Conclusion: Jonathan Blake Brannon continues to be a leading figure in the world of invention, inspiring others with his work and vision.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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