McLean, VA, United States of America

Michael A Sipe

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: International Business Machines Corporation. Active years: 1995.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Michael A. Sipe: Innovator in Substrate Inspection Technology

Introduction

Michael A. Sipe is an accomplished inventor based in McLean, Virginia. He is known for his innovative contributions to the field of substrate inspection technology. With a focus on enhancing the accuracy of chip and heatsink matching, Sipe has made significant strides in improving manufacturing processes.

Latest Patents

Sipe holds a patent for a "Method and apparatus for inspection of matched substrate heatsink." This invention comprises a method and apparatus designed to inspect substrates and heatsink assemblies. The goal is to determine whether the chips on the substrate and pistons on the heatsink assembly are matched. The inspection process involves separately illuminating both the substrate and the heatsink assembly to create bilevel images of each. These images are captured by an associated image-acquisition device, such as a television or video camera. The captured images are then converted into an array of image points. The points of the substrate assembly image are compared with a preset pattern to identify any missing chips. A similar comparison is conducted for the heatsink assembly to check for missing pistons. Any deviation from the expected pattern is communicated to an operator for corrective action.

Career Highlights

Michael A. Sipe is currently employed at International Business Machines Corporation (IBM). His work at IBM has allowed him to collaborate with other talented professionals in the field of technology and innovation.

Collaborations

One of his notable coworkers is Frederick G. Weindelmayer. Their collaboration has contributed to advancements in substrate inspection technology.

Conclusion

Michael A. Sipe's innovative work in substrate inspection technology exemplifies the impact of dedicated inventors in the field. His patent reflects a commitment to improving manufacturing processes and ensuring quality in technology.

Profile summary based on public USPTO records.
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