Michael A Gilmore

Title: Michael A. Gilmore: Innovator in Sample Inspection Technology

Introduction

Michael A. Gilmore is an accomplished inventor based in Bend, OR (US). He has made significant contributions to the field of sample inspection technology. His innovative approach focuses on detecting defects using surface topography data, which has implications for various industries.

Latest Patents

Michael A. Gilmore holds 1 patent for his invention titled "Sample inspection using topography." This patent describes a method for detecting defects by analyzing topography characteristics within a region of interest on a sample. By comparing these characteristics with those of a reference surface, common patterns can be filtered out, allowing for the identification of variations that indicate defects. The method includes using thresholds to identify defect candidates based on their size, height, shape, and texture. In some cases, prior knowledge of the required surface topography can be utilized to determine the presence of defects without a reference surface.

Career Highlights

Michael has built a successful career in the field of technology and innovation. He is currently employed at Onto Innovation Inc., where he continues to develop and refine his ideas. His work has contributed to advancements in quality control and defect detection processes.

Collaborations

Throughout his career, Michael has collaborated with talented individuals such as Nigel P. Smith and Holly M. Edmundson. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Michael A. Gilmore is a notable inventor whose work in sample inspection technology has the potential to enhance defect detection methods across various industries. His contributions reflect a commitment to innovation and excellence in his field.