Calgary, Canada

Michael A Eddy

This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael A Eddy. Retrieved from https://idiyas.com/inventor/michael-a-eddy-wjz5qy69

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: Michael A. Eddy: Innovator in Gas Analysis Technology

Introduction

Michael A. Eddy is a notable inventor based in Calgary, Canada. He has made significant contributions to the field of gas analysis, particularly in well-related operations. His innovative work focuses on methods and devices that enhance the detection of hydrocarbons in drilling fluids.

Latest Patents

Michael A. Eddy holds a patent for "Methods And Devices For Analyzing Gases In Well-Related Fluids Using Fourier Transform Infrared (FTIR) Spectroscopy." This patent describes devices, assemblies, systems, and methods that are useful in the real-time analysis of gases extracted from fluids associated with ongoing well-related operations. The exemplary method involves receiving gas extracted from the fluid, analyzing it using FTIR spectroscopy, and generating signals that help determine the gas composition.

Career Highlights

Michael A. Eddy is associated with Total Gas Detection Ltd., where he applies his expertise in gas detection technologies. His work is crucial for improving safety and efficiency in well-related operations.

Collaborations

Michael has collaborated with notable professionals in his field, including Frederick G. Haibach and Erik R. Deutsch. Their combined efforts contribute to advancements in gas analysis technologies.

Conclusion

Michael A. Eddy is a prominent figure in the field of gas analysis, with a focus on enhancing the detection of hydrocarbons in well-related fluids. His innovative methods and devices are paving the way for safer and more efficient operations in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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