Shanghai, China

Mi Zhou

This inventor holds 15 USPTO granted patents and 1 published patent application, plus 1 CIPO patent and 3 EPO patents. Top assignees: Mettler-Toledo Gmbh, Seari Electric Technology Co., Ltd., Zhejiang Chint Electrics Co., Ltd.. Active years: 2018-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mi Zhou. Retrieved from https://idiyas.com/inventor/mi-zhou-26o5pjuf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 15 

% Patents Active = 100.0


 

Average Co-Inventor Count = 7.6

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2018-2026

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15 patents (USPTO):Explore Patents

Title: Inventor Profile: Mi Zhou

Introduction

Mi Zhou is an accomplished inventor based in Shanghai, China, renowned for holding a remarkable 13 patents. His innovative contributions have significantly impacted the field of technology, particularly in weighing apparatuses.

Latest Patents

Among his notable inventions, Mi Zhou's latest patents include advancements in weighing apparatuses. These inventions demonstrate his commitment to enhancing measurement precision and technology efficiency.

Career Highlights

Mi Zhou has made significant strides in his career, collaborating with esteemed organizations such as Mettler-Toledo GmbH and Seari Electric Technology Co., Ltd. His work with these companies has solidified his reputation as a leading inventor in his field.

Collaborations

Throughout his career, Mi Zhou has had the opportunity to work alongside talented individuals including Thilo Hogrebe and Sandra Ehrbar. Their collaboration has fostered creativity and innovation, contributing to the development of groundbreaking technology.

Conclusion

In summary, Mi Zhou exemplifies the spirit of innovation through his extensive work in the field of weighing technologies. With a portfolio of 13 patents and collaborations with industry leaders, he continues to pave the way for future advancements in measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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