Seoul, South Korea

Mi Young Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Medison Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mi Young Lee. Retrieved from https://idiyas.com/inventor/mi-young-lee-mmp2ocz4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mi Young Lee and Ultrasonic Diagnostic Innovation.

Introduction

Mi Young Lee is an inventor based in Seoul, South Korea, associated with Samsung Medison Co., Ltd. Lee’s patent work concerns ultrasonic diagnostic technology and the use of learning algorithms to support Doppler waveform measurement.

Latest Patents

The available information lists one patent for Lee: “Ultrasonic Diagnostic Apparatus, Operating Method Thereof, and Recording Medium on Which Learning Algorithm Is Recorded.” The invention describes an apparatus that analyzes a Doppler waveform’s shape, identifies the Doppler signal type, selects waveform areas, and calculates similarities to determine a measurement area. It then calculates a measurement index and displays the waveform, selected area, and index. Lee is credited with 1 patent.

Career Highlights

Lee’s listed patent reflects work on applying learning algorithms to ultrasonic diagnostic measurements. The disclosed system is designed to help identify relevant waveform regions and derive measurement indices.

Collaborations

Lee is associated with Samsung Medison Co., Ltd. The provided information also names Kwang Yeon Choi, a woman, as a coworker; it does not specify her role in the patent.

Conclusion

Mi Young Lee’s listed invention focuses on algorithm-assisted Doppler waveform analysis, connecting ultrasonic imaging technology with automated measurement support.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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