Meong Hun Lee

Title: Meong Hun Lee and Smart-Farm Crop Phenotyping

Introduction

Meong Hun Lee is an inventor based in Seoul, South Korea, associated with the Industry-Academic Cooperation Foundation of Sunchon National University. Her work focuses on using imaging technologies to analyze crop growth and plant phenotypes in smart-farm settings.

Latest Patents

Lee is associated with 1 patent: “Apparatus for Analyzing Crop Growth Information Through Multiple Composite Images and Method for Exploring Plant Phenotypes Using the Same.” The disclosed technique uses RGB, thermal-imaging, and hyperspectral cameras to capture crop images. RGB images help distinguish crop phenotypes, while thermal and hyperspectral images, including composite images, can be analyzed for indicators such as vegetation index and water stress. This information can help growers assess environmental resistance and select crop characteristics suited to the region, climate, and terrain of a smart farm, with the stated aim of improving smart-farm profitability.

Career Highlights

Lee’s patent work brings together multiple imaging methods to support crop-growth analysis and phenotype exploration. The approach is designed to provide growers with information for comparing crop characteristics under different environmental conditions.

Collaborations

Lee’s listed coworkers include Hyun Yoe and Seung Jae Kim. Her organizational affiliation is the Industry-Academic Cooperation Foundation of Sunchon National University.

Conclusion

Meong Hun Lee’s patent describes a multi-camera approach to crop phenotyping that may help growers evaluate plant traits and environmental responses in smart-farm conditions.