Company Filing History:
Years Active: 2024-2025
Title: Innovations of Mengzhou Li in X-ray Photon-Counting Data Correction
Introduction
Mengzhou Li is an accomplished inventor based in Troy, NY (US). He has made significant contributions to the field of medical imaging, particularly through his innovative work on X-ray photon-counting data correction. His research focuses on enhancing the accuracy and reliability of X-ray imaging techniques.
Latest Patents
Mengzhou Li holds a patent for a method titled "X-ray photon-counting data correction through deep learning." This method involves generating training input spectral projection data based on reference spectral projection data. The training input data addresses various distortions, including pulse pileup distortion, charge splitting distortion, and noise. The process further includes training a data correction artificial neural network (ANN) that incorporates both pulse pileup correction and charge splitting correction ANNs. This innovative approach aims to improve the quality of X-ray imaging by effectively correcting data inaccuracies.
Career Highlights
Mengzhou Li is affiliated with Rensselaer Polytechnic Institute, where he continues to advance his research in the field of imaging technology. His work has garnered attention for its potential to revolutionize how X-ray data is processed and interpreted.
Collaborations
Some of his notable coworkers include Ge Wang and David S Rundle, who have collaborated with him on various projects related to imaging and data correction technologies.
Conclusion
Mengzhou Li's contributions to X-ray photon-counting data correction through deep learning represent a significant advancement in medical imaging technology. His innovative methods have the potential to enhance diagnostic accuracy and improve patient outcomes.