Company Filing History:
Years Active: 2025
Title: Menglong Yang - Innovator in 3-Dimensional Measurement Technology
Introduction
Menglong Yang is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to 3-dimensional parcel measurement devices. His work focuses on enhancing the accuracy of object measurements through advanced imaging techniques.
Latest Patents
Menglong Yang holds a patent for a 3-dimensional parcel measurement device that utilizes captured images and depth measurement. This device is designed to measure the shape of an object with high accuracy. The measurement system includes a frame recognition unit that detects frames indicating straight line portions from captured images, a depth measurement unit for performing depth measurements, and a dimension estimation unit that calculates the length of a frame based on the captured image and depth measurement results. Additionally, the system can specify a range in which the measurement target object is present from the captured image. He has 1 patent to his name.
Career Highlights
Menglong Yang is currently employed at the Nomura Research Institute, Ltd., where he continues to develop innovative solutions in measurement technology. His expertise and dedication to his work have positioned him as a valuable asset in his field.
Collaborations
Some of his coworkers include Satomi Tanabe and Satoshi Takahashi, who contribute to the collaborative environment at the Nomura Research Institute, Ltd. Their combined efforts foster innovation and drive advancements in technology.
Conclusion
Menglong Yang's contributions to 3-dimensional measurement technology exemplify the impact of innovative thinking in the field. His patent for a measurement device showcases his commitment to accuracy and efficiency in object measurement.