The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Sep. 02, 2022
Nomura Research Institute, Ltd., Tokyo, JP;
Menglong Yang, Kanagawa, JP;
Satomi Tanabe, Tokyo, JP;
Satoshi Takahashi, Kanagawa, JP;
Naoki Shimizu, Tokyo, JP;
Nomura Research Institute, Ltd., Tokyo, JP;
Abstract
The shape of an object is measured with high accuracy. A measurement system includes a frame recognition unit configured to detect one or more frames indicating a straight line portion from a captured image, a depth measurement unit configured to perform depth measurement, and a dimension estimation unit configured to calculate a length of a frame on a basis of the captured image and a result of the depth measurement. The measurement system may have a function of specifying a range in which a measurement target object is present from the captured image.