This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Oto Photonics Inc.. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: The Innovations of Meng-Wei Lee
Introduction
Meng-Wei Lee is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of electronic circuitry, particularly in the development of spectrometers. His innovative work has led to the creation of a patented technology that enhances measurement capabilities in various applications.
Latest Patents
Meng-Wei Lee holds a patent for "Electronic circuitry for controlling in order to perform exposure measurements continuously, spectrometer using the same and measurement method of the spectrometer." This invention involves an electronic circuitry of a spectrometer that connects with an optical sensor. The circuitry includes a memory unit for storing measurement settings, a trigger line for transmitting trigger signals, and a control unit that manages the exposure measurements. This technology allows for continuous exposure measurements and the storage of spectral data, significantly improving the efficiency of spectrometric analysis.
Career Highlights
Meng-Wei Lee is currently associated with Oto Photonics Inc., where he continues to innovate in the field of optical technologies. His work has been instrumental in advancing the capabilities of spectrometers, making them more effective for various scientific and industrial applications.
Collaborations
Meng-Wei Lee has collaborated with notable colleagues such as Hsu Feng Cheng and Jan Liang Yeh. Their combined expertise has contributed to the successful development of advanced optical technologies.
Conclusion
Meng-Wei Lee's contributions to electronic circuitry and spectrometry exemplify the impact of innovative thinking in technology. His patented inventions continue to influence the field and enhance measurement techniques in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile