Taipei, Taiwan

Meng-tsan Tsai

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Opxion Technology Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Meng-tsan Tsai. Retrieved from https://idiyas.com/inventor/meng-tsan-tsai-jmqm71cy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Meng-tsan Tsai and Optical Scanning Innovation

Introduction

Meng-tsan Tsai is an inventor based in Taipei, Taiwan. His work includes an optical scanning system designed to capture three-dimensional structural information without damaging the object being inspected.

Latest Patents

Tsai is associated with 1 patent, titled “Optical Scanning System for Non-Destructively Acquiring Three-Dimensional Structure of Object.” The invention combines an optical image processing device with an optical scanning device. The processing device generates a beam along a first optical axis, while the scanning device redirects it along a second optical axis to scan the object.

By scanning across the X- and Y-axis directions, the system acquires YZ and XZ cross-sectional images at successive positions. These images can then be used to reconstruct a three-dimensional structural image without destructive examination.

Career Highlights

Tsai is associated with Opxion Technology Inc. His patent describes an approach to optical inspection that brings together beam redirection, cross-sectional imaging, and three-dimensional reconstruction.

Collaborations

The patent’s listed collaborators include Feng-Yu Chang and Wen-Ju Chen. Their work is associated with the development of the optical scanning system.

Conclusion

Meng-tsan Tsai’s patent presents a non-destructive optical scanning method for reconstructing an object’s three-dimensional structure from cross-sectional images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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