Boston, MA, United States of America

Meng Lu

This inventor holds 1 USPTO granted patent. Top assignee: Metalenz, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Meng Lu. Retrieved from https://idiyas.com/inventor/meng-lu-ezvyyp4q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Inventor Meng Lu

Introduction

Meng Lu is an accomplished inventor based in Boston, MA (US). He has made significant contributions to the field of imaging technology. His work focuses on advanced camera systems that enhance the capabilities of traditional imaging devices.

Latest Patents

Meng Lu holds a patent for a "Shared-aperture camera system and calibration method." This innovative system includes a polarization imaging device with an aperture and a first metasurface. The metasurface is designed to diffract incident light, allowing different polarizations of light to be directed to specific areas of an image sensor. This technology aims to improve the accuracy and efficiency of imaging systems.

Career Highlights

Meng Lu is currently employed at Metalenz, Inc., where he continues to develop cutting-edge imaging solutions. His expertise in optics and imaging has positioned him as a key player in the advancement of camera technologies. He has a total of 1 patent to his name, showcasing his innovative contributions to the field.

Collaborations

Meng Lu collaborates with Seyedali Forouzmand, working together to push the boundaries of imaging technology. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Meng Lu's work in shared-aperture camera systems represents a significant advancement in imaging technology. His contributions continue to influence the field and pave the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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