Hsinchu, Taiwan

Meng-Fen Le

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Meng-Fen Le. Retrieved from https://idiyas.com/inventor/meng-fen-le

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Meng-Fen Le

Introduction

Meng-Fen Le is an accomplished inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of printing technology. His innovative approach has led to the development of a unique multi-pass printing apparatus.

Latest Patents

Meng-Fen Le holds a patent for a "Multi-pass print apparatus and method." This invention provides a method where print data is divided into multiple passes. Each pass is printed according to different delay position signals, ensuring a complete print output. The method utilizes a complementary mask technique or classifies pixels based on their horizontal positions.

Career Highlights

Meng-Fen Le is associated with the Industrial Technology Research Institute, where he continues to advance printing technologies. His work has garnered attention for its practical applications in improving print quality and efficiency.

Collaborations

Meng-Fen Le collaborates with talented individuals such as Hsiao-Yu Han and Yao-Wen Huang. Their combined expertise contributes to the innovative projects at the Industrial Technology Research Institute.

Conclusion

Meng-Fen Le's contributions to printing technology exemplify the spirit of innovation. His patent and collaborative efforts highlight the importance of teamwork in advancing technological solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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