Meng-chieh Cheng

Title: Meng-chieh Cheng: Advancing Probe Card Technology

Introduction

Meng-chieh Cheng is an inventor based in Taipei, Taiwan, whose work focuses on probe card components used to test electronic devices. His listed portfolio includes 2 patents, including inventions involving elastic probe structures. He is associated with Chunghwa Precision Test Tech. Co., Ltd.

Latest Patents

Cheng’s listed patents address two types of probes designed to make electrical contact with a device under test while accommodating movement and generating an elastic force.

“Probe card device and tunnel-type probe thereof” describes a tunnel-type probe with a tube, an elastic member, and a movable pin. The pin connects electrically to the tube through the elastic member. When its contacting segment presses against a device under test, the pin moves and deforms the elastic member, which generates a restoring force.

“Vertical probe card and open-type probe thereof” describes an open-type probe built around a frame with an operation slot and lateral openings. An elastic member sits in the slot, while a pin’s inner segment presses against it and electrically couples to the frame. Contact with a device under test moves the pin into the slot, deforming the elastic member and producing an elastic force.

Career Highlights

Cheng’s listed inventions focus on probe structures that combine electrical coupling with compliant mechanical movement. The designs use elastic members to support pin movement during contact with devices under test.

Collaborations

Cheng is associated with Chunghwa Precision Test Tech. Co., Ltd. His listed coworkers include Yu-ju Lu and Yi-hsien Chen.

Conclusion

Meng-chieh Cheng’s two listed patents describe tunnel-type and open-type probe designs that use elastic components to support reliable contact and movement during electronic device testing.