Company Filing History:
Years Active: 2025
Title: The Innovative Contributions of Melissa Keefe
Introduction
Melissa Keefe is a notable inventor based in Cortlandt Manor, NY (US). She has made significant contributions to the field of integrated circuit (IC) testing. Her innovative approach has led to the development of a unique test probe that enhances the efficiency of electrical characterization in IC devices.
Latest Patents
Melissa holds a patent for a "Clustered Rigid Wafer Test Probe." This invention features an IC device test probe that incorporates one or more clusters of tapered probe tips. These tips taper upon a taper plane that is orthogonal to the seating direction or force vector of the probe toward the IC device. Each tapered probe tip is designed to seat against one contact of the IC device, allowing the probe to apply test signals to multiple contacts either serially or simultaneously. This design facilitates the testing of small pitch IC devices, enabling effective electrical characterization through multiple contacts.
Career Highlights
Melissa Keefe is associated with International Business Machines Corporation (IBM), where she has contributed her expertise in IC testing technologies. Her work has been instrumental in advancing the capabilities of testing equipment used in the semiconductor industry.
Collaborations
Throughout her career, Melissa has collaborated with talented individuals such as David Michael Audette and Grant W Wagner. These partnerships have fostered innovation and have led to the successful development of advanced testing solutions.
Conclusion
Melissa Keefe's contributions to the field of integrated circuit testing exemplify her innovative spirit and dedication to advancing technology. Her patent for the clustered rigid wafer test probe is a testament to her expertise and impact in the industry.