This inventor holds 7 USPTO granted patents and 1 published patent application. Top assignees: Airadvice, Inc., Other. Active years: 2000-2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Solon, OH (US) (2000)
- Vancouver, WA (US) (2005 - 2009)
Company Filing History:
Years Active: 2000-2009
Title: Meindert J Kleefstra: Innovator in Particle Sizing and Sensor Technology
Introduction
Meindert J Kleefstra is a notable inventor based in Vancouver, WA (US). He has made significant contributions to the fields of particle sizing and sensor technology, holding a total of 7 patents. His innovative work has paved the way for advancements in various applications.
Latest Patents
Kleefstra's latest patents include a "Particle Sizing Refinement System," which specifies a plurality of particle size reference values. This system obtains data based at least in part on these specified reference values. Another notable patent is for "Sensor Drift Characteristic Testing," which describes apparatuses, articles, methods, and systems for measuring sensor drift characteristics. This system includes a sensor platform to receive a sensor and measure its drift characteristics, along with a data acquisition device to evaluate the sensor's acceptability based on acceptance criteria.
Career Highlights
Throughout his career, Kleefstra has worked with various companies, including Airadvice, Inc. His experience in these organizations has contributed to his expertise in developing innovative technologies.
Collaborations
Kleefstra has collaborated with notable individuals in his field, including Roger L Verkuil and Steven J Carnegie. These partnerships have likely enhanced his work and led to further advancements in his projects.
Conclusion
Meindert J Kleefstra's contributions to particle sizing and sensor technology demonstrate his innovative spirit and dedication to advancing these fields. His patents reflect a commitment to improving measurement systems and sensor reliability.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile