Taipei, Taiwan

Mei-Ling Lee

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Institute for Information Industry. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mei-Ling Lee. Retrieved from https://idiyas.com/inventor/mei-ling-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Mei-Ling Lee and Industrial Control System Security.

Introduction

Mei-Ling Lee is an inventor based in Taipei, Taiwan. Her work includes a patented system and method for identifying application-layer behavior to help detect intrusions into industrial control systems.

Latest Patents

Lee is associated with 1 patent: “System and Method for Identifying Application Layer Behavior.” The invention analyzes packets exchanged between master and slave devices in an industrial control system to determine the system’s current application-layer behavior. It then compares that behavior with a list of normal behavior patterns to assess whether activity is normal and help identify potential intrusions.

Career Highlights

Lee is associated with the Institute for Information Industry. Her patent focuses on monitoring communications within industrial control systems, where identifying abnormal application-layer behavior can support intrusion detection.

Collaborations

Lee’s listed coworkers include Sung-Lin Wu and Chih-Ta Lin. Their names are associated with her work on identifying application-layer behavior in industrial control systems.

Conclusion

Mei-Ling Lee’s patent addresses industrial cybersecurity by using packet analysis and normal-behavior comparisons to help detect potentially abnormal activity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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