San Francisco, CA, United States of America

Mei Chun Yeh

This inventor holds 11 USPTO granted patents. Top assignees: Splunk Inc., Cisco Technology, Inc.. Active years: 2022-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mei Chun Yeh. Retrieved from https://idiyas.com/inventor/mei-chun-yeh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.6

ph-index = 7

Forward Citations = 133(Granted Patents)


Company Filing History:


Years Active: 2022-2026

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11 patents (USPTO):Explore Patents

Title: Innovations of Mei Chun Yeh

Introduction

Mei Chun Yeh is a prominent inventor based in San Francisco, CA. He has made significant contributions to the field of technology, holding a total of 10 patents. His work primarily focuses on enhancing user interfaces and data management applications.

Latest Patents

One of his latest patents includes a display screen or portion thereof with a graphical user interface for a setup process in a data management application. This innovation aims to streamline the user experience and improve the efficiency of data management tasks.

Career Highlights

Throughout his career, Mei Chun Yeh has worked with notable companies such as Splunk Inc. and Cisco Technology, Inc. His experience in these organizations has allowed him to develop cutting-edge technologies that have a lasting impact on the industry.

Collaborations

Mei Chun Yeh has collaborated with talented individuals, including Iryna Vogler-Ivashchanka and Tatsuya Hama. These partnerships have fostered a creative environment that encourages innovation and the development of new ideas.

Conclusion

Mei Chun Yeh's contributions to technology through his patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence the way we interact with data management applications and user interfaces.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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